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302 RESULTATEN

Stages en afstudeeropdrachten in België

A — Stages en afstudeeropdrachten in België302
NRFUNCTIEWERKGEVERPLAATS
121Ternary-blend Halide Perovskites for Thin-Film Photonic Devices: From Photodetectors to LEDs and Lasers
Stages
imecLeuven
122Thermal and Mechanical Co-Design of Future Chiplet Systems Using Physics-Informed Machine Learning
Stages
imecLeuven
123Thin-Film Deposition of Prussian Blue Analogue based room temperature Magnets
Stages
imecLeuven
124Thin-Film Ferroelectrics for Low-Loss Quantum Microwave Devices
Stages
imecLeuven
125Thin-Film Ga₂O₃ for Next Generation Deep-UV Sensing
Stages
imecLeuven
126Towards 4D Spatial Omics in Organ-on-Chip platforms
Stages
imecLeuven
127Towards High-Endurance fast-erase 3D FeFETs with OSC channel
Stages
imecLeuven
128Towards Predictive Reliability: Correlative Characterisation of Buried Interfaces in Emerging Thin-Film Materials and Devices
Stages
imecGenk
129Ultra-Low-Loss Fiber-to-Chip Coupling for Next-Generation Photonic and Quantum Systems
Stages
imecGent
130Ultrafast dynamics of thin film LEDs and lasers
Stages
imecLeuven
131Ultrafast, Multiplexed EUV Scatterometry for Device Metrology in the Ångström and Quantum Technology Eras
Stages
imecLeuven
132Understanding High Optical Power Induced Degradation Mechanisms in Si Photonic Devices
Stages
imecLeuven
133Understanding the surface chemistry of amorphous carbon materials to enable area-selective atomic layer deposition on complex 3D integration architectures
Stages
imecLeuven
134Unified Acoustical Radios and Protocols Designs for Underwater Communication, localization and Sensing
Stages
imecGent
135Unraveling Next-gen 3D NAND Flash Through Model-Driven Experiments
Stages
imecLeuven
136Unraveling the origins of strain variability in NS and CFET transistors through advanced TEM and EELS
Stages
imecLeuven
137Upscaling physics simulations at system-level with AI and finite elements
Stages
imecLeuven
138Voltage-controlled exchange coupling for next-generation low-power MRAM
Stages
imecLeuven
139[NanoIC] Advancing Ultrasonic Inspection for Voids in Heterogeneously Integrated Semiconductor Devices
Stages
imecLeuven
140[NanoIC] Circuit design exploration for quasi-adiabatic compute in the most advanced technology nodes
Stages
imecLeuven
141[NanoIC] Design-Technology Co-Optimization for embedded and heterogeneously integrated devices in future semiconductor systems
Stages
imecLeuven
142[NanoIC] Inline metrology with Atomic Force Microscopy: from homogeneous smooth surfaces to high-aspect-ratio multi-material devices
Stages
imecLeuven
143[NanoIC] Metrology and Defectivity Study in 3D Patterning Processes
Stages
imecLeuven
144[NanoIC] Reliability characterization of CMOS 2.0 nodes using low-frequency noise​ ​
Stages
imecLeuven
145[NanoIC] Reliability of semiconducting oxides: the last roadblock for memory applications
Stages
imecLeuven
146[NanoIC] Revealing Yet-Unknown Manufacturing Defects in Advanced Semiconductor Technologies
Stages
imecLeuven
147[NanoIC] Revealing the Structure-Composition Role on Ultrafast Carrier Dynamics in Advanced Logic and Memory Devices
Stages
imecLeuven
1482D nanocrystals as water-tight ionic membranes for low-temperature CO2 electrolysis
Stages
imecLeuven
1493D Object Shape Characterization Using Integrated Sensing and Communication (ISAC) Network
Stages
imecLeuven
150AI-Driven Process Optimization for TEM Automation
Stages
imecLeuven
151ALD TiO2 Passivation of Sb2S3 Photocathodes for Photoelectrochemical Hydrogen Production
Stages
imecGenk
152Admittance modeling for scoping defects in advanced germanium Metal-Oxide-Semiconductor gate stacks for CFET
Stages
imecLeuven
153Advanced (multi-wire) interconnection and lamination technologies for integrated PV
Stages
imecGenk
154Advanced Characterization of Hafnium-Based Ferroelectric Capacitors to Reveal Interdependencies Among Critical Reliability Phenomena
Stages
imecLeuven
155Advanced material analysis - nuclear reaction analysis (NRA) depth profiling at the Van de Graaff accelerator through automating the voltage control with LabView.
Stages
imecLeuven
156Advancing Cardiotoxicity Testing with Electrical Pacing and CMOS Biosensing
Stages
imecLeuven
157Analog Integrated Circuit Design for Photonic Drift Compensation
Stages
imecLeuven
158Analog Integrated Circuit Design for Photonic Drift Compensation
Stages
imecLeuven
159Application-Driven Memory xTCO
Stages
imecLeuven
160Atomic modelling of bond strength for dielectric breakdown predictions
Stages
imecLeuven

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